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AFMimageRoughGlass20x20.JPG (398 × 308 pixels, file size: 41 KB, MIME type: image/jpeg)
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| Description | Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco di CP-II, scanned in contact mode. Constructed at the Nanorobotics Laboratory at Carnegie Mellon University (http://nanolab.me.cmu.edu). |
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- File:AFMimageRoughGlass20x20.png licensed with PD-self
- 2009-02-19T17:43:06Z Linforest 401x326 (191303 Bytes) {{Information |Description=Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) =
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 23:33, 14 July 2009 | | 398 × 308 (41 KB) | Materialscientist | {{Information |Description=Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM |
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